BASICS OF CRYSTALLOGRAPHY:

Basis and lattice points, Lattice types in 2D and 3D, Planes and Directions, Miller’s and Weber’s indices, Directions in planes, Zone of planes, Atomic/fractional Coordinates, Crystal systems and Crystal structures, Twinned crystals, Real and reciprocal lattices, Reciprocal lattice and Bragg’s law

CRYSTAL SYMMETRY:

Axes of symmetry, Point groups, Crystal classes, Crystal system and Stereographic projection

PRODUCTION AND PROPERTIES OF X-RAYS:

Production, Absorption, Characteristics, Filters, Detection, Coherent and Incoherent scattering

DIFFRACTION OF X-RAYS:

Diffraction, Bragg’s Law, X-ray Spectroscopy, Diffraction directions, Diffraction methods

INTENSITIES OF DIFFRACTION BEAMS:

Scattering by an electron, an atom and a unit cell, Structure factor calculations, Application to Powder Method, Multiplicity factor, Temperature factor, Intensity calculations

EXPERIMENTAL METHODS:

Laue Methods, Rotating Crystal Method, X-ray Powder Diffractometry (θ- θ, θ-2θ), X-ray Reflectometry (XRR), Grazing Incidence Angle X-ray Diffraction (GIXRD)

DETERMINATION OF CRYSTAL STRUCTURE:

Treatment of Data, Indexing of cubic and non-cubic crystals, Direct Method, Determination of number of atoms in a unit cell, Determination of atomic position, Introduction and Applications of Crystal Structure Determination - Computer Programs, Refinement of Diffraction data using Rietveld’s approach